1. MOCA ARM: Analog Reliability Measurement based on Monte Carlo Analysis

S. Taghipour; R. Niaraki Asli

Volume 4, Issue 1 , Winter and Spring 2016, , Pages 9-14

  Due to the expected increase of defects in circuits based on deep submicron technologies, reliability has become an important design criterion. Although different approaches have been developed to estimate reliability in digital circuits and some measuring concepts have been separately presented to reveal ...  Read More