A new low power high reliability flip-flop robust against process variations

S. Yousefian Langroudi; R. Niaraki Asli

Volume 4, Issue 2 , July 2016, , Pages 127-135


  Low scaling technology makes a significant reduction in dimension and supply voltage, and lead to new challenges about power consumption such as increasing nodes sensitivity over radiation-induced soft errors in VLSI circuits. In this area, different design methods have been proposed to low power flip-flops ...  Read More

MOCA ARM: Analog Reliability Measurement based on Monte Carlo Analysis

S. Taghipour; R. Niaraki Asli

Volume 4, Issue 1 , January 2016, , Pages 9-14


  Due to the expected increase of defects in circuits based on deep submicron technologies, reliability has become an important design criterion. Although different approaches have been developed to estimate reliability in digital circuits and some measuring concepts have been separately presented to reveal ...  Read More