A new low power high reliability flip-flop robust against process variations

S. Yousefian Langroudi; R. Niaraki Asli

Volume 4, Issue 2 , July 2016, , Pages 127-135


  Low scaling technology makes a significant reduction in dimension and supply voltage, and lead to new challenges about power consumption such as increasing nodes sensitivity over radiation-induced soft errors in VLSI circuits. In this area, different design methods have been proposed to low power flip-flops ...  Read More